Kenneth A. LaBel

Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

David F. Heidel, Paul W. Marshall, Jonathan A. Pellish et al. · IEEE Transactions on Nuclear Science · 2009 · 163 citations

Engineering, Computer Engineering, Electrical Engineering +8

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

David F. Heidel, Paul W. Marshall, Kenneth A. LaBel et al. · IEEE Transactions on Nuclear Science · 2008 · 157 citations

Engineering, Computer Engineering, Electrical Engineering +15

SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile Memory

Timothy R. Oldham, Ray Ladbury, M. Friendlich et al. · IEEE Transactions on Nuclear Science · 2006 · 109 citations

Engineering, Computer Engineering, Electrical Engineering +15

Particle-induced bit errors in high performance fiber optic data links for satellite data management

Paul W. Marshall, C.J. Dale, Martin A. Carts et al. · IEEE Transactions on Nuclear Science · 1994 · 102 citations

Engineering, Electrical Engineering, Physics +15

Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)

Paul W. Marshall, Martin A. Carts, Steve Currie et al. · IEEE Transactions on Nuclear Science · 2005 · 100 citations

Engineering, Computer Engineering, Electrical Engineering +13