M. Friendlich

Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

Brian D. Sierawski, Jonathan A. Pellish, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2009 · 191 citations

Rate Predictions, Low Energy Protons, Electrical Engineering +14

Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

David F. Heidel, Paul W. Marshall, Jonathan A. Pellish et al. · IEEE Transactions on Nuclear Science · 2009 · 162 citations

Hardware Security, Electrical Engineering, Engineering +15

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

David F. Heidel, Paul W. Marshall, Kenneth A. LaBel et al. · IEEE Transactions on Nuclear Science · 2008 · 156 citations

Hardware Security, Experimental Results, Electrical Engineering +14

Effectiveness of Internal Versus External SEU Scrubbing Mitigation Strategies in a Xilinx FPGA: Design, Test, and Analysis

Melanie D. Berg, C. Poivey, David Petrick et al. · IEEE Transactions on Nuclear Science · 2008 · 137 citations

Hardware Security, Electrical Engineering, Engineering +12

SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile Memory

Timothy R. Oldham, Ray Ladbury, M. Friendlich et al. · IEEE Transactions on Nuclear Science · 2006 · 106 citations

Non-volatile Memory, Electrical Engineering, Engineering +13