Robert A. Reed - Concepedia

Author

Robert A. Reed

Vanderbilt University ORCID

Also Known As

C. Rea, D Fleetwood, H Kim, Hauser, Reiner, Joel M. Hales, Michael Eberlein, R A Reed, R Kar, R Reed, R. A. D. Reed

614

Publications

13.3K

Citations

H-Index

320

Concepts

All Affiliations

Vanderbilt University Goddard Space Flight Center Georgia Institute of Technology Sandia National Laboratories Auburn University

About

Robert A. Reed is an author at Vanderbilt University specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	58	283	11K
2	Natural Sciences	31	62	2.6K
3	Medicine	23	32	1.6K
4	Health Sciences	17	21	694
5	Education	3	3	187

Robert A. Reed

317

Publications

12.4K

Citations

H-Index

Page 1

	Year	Citations
Monte Carlo Simulation of Single Event Effects Robert A. Weller, Marcus H. Mendenhall, Robert A. Reed, IEEE Transactions on Nuclear Science EngineeringMonte Carlo MethodsSimulationMonte Carlo ComputationsElectromagnetic Compatibility	2010	217
Evaluation of Hydroperoxides in Common Pharmaceutical Excipients Walter Wasylaschuk, Paul A. Harmon, Gabriella Wagner, Journal of Pharmaceutical Sciences Pharmaceutical ScienceCommon Pharmaceutical ExcipientsExcipientsMedicinePharmaceutical Technology	2006	202
Scale dependence of vegetation‐environment correlations: A case study of a North Carolina piedmont woodland Robert A. Reed, Robert K. Peet, Michael W. Palmer, Journal of Vegetation Science Landscape ProcessesVegetation‐environment CorrelationsEcosystem StructureEngineeringBiogeography	1993	196
Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions Brian D. Sierawski, Jonathan A. Pellish, Robert A. Reed, IEEE Transactions on Nuclear Science Rate PredictionsLow Energy ProtonsElectrical EngineeringHeavy Ion PhysicEngineering	2009	191
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM Kevin M. Warren, Robert A. Weller, Marcus H. Mendenhall, IEEE Transactions on Nuclear Science Charge DepositionIon ImplantationEngineeringNuclear PhysicsPhysics	2005	169
Radiation Effects in Advanced Multiple Gate and Silicon-on-Insulator Transistors Eddy Simoen, Marc Gaillardin, Philippe Paillet, IEEE Transactions on Nuclear Science Electrical EngineeringPlanar DevicesEngineeringPhysicsNanoelectronics	2013	143
Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes Dennis R. Ball, John M. Hutson, Arto Javanainen, IEEE Transactions on Nuclear Science Electrical EngineeringEngineeringPower DeviceNanoelectronicsBias Temperature Instability	2019	129
Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits P.E. Dodd, J.R. Schwank, M.R. Shaneyfelt, IEEE Transactions on Nuclear Science Nuclear InteractionsElectrical EngineeringSingle-event UpsetEngineeringVlsi Design	2007	121
Rapid at-line analysis of coating thickness and uniformity on tablets using laser induced breakdown spectroscopy Mark D. Mowery, Robert Sing, John D. Kirsch, Journal of Pharmaceutical and Biomedical Analysis Materials ScienceAdvanced Laser ProcessingEngineeringBreakdown SpectroscopyOptical Diagnostics	2002	120
Impact of Ion Energy and Species on Single Event Effects Analysis Robert A. Reed, Robert A. Weller, Marcus H. Mendenhall, IEEE Transactions on Nuclear Science Rate PredictionsRadiation EventsHealth SciencesMessenger MissionRadiation Exposure	2007	117

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