IEEE Transactions on Nuclear Science · 2005 · 173 citations · 15 references
EngineeringElectrical EngineeringPhysicsNuclear PhysicsRadiation MeasurementRadiation TransportHeavy-ion PhysicsMonte Carlo Radiation TransportMonte Carlo Transport MethodsNuclear Cross SectionsRadiation Damage In MaterialsRadiation HardeningCross-section MeasurementDirect Nuclear ReactionsMonte Carlo Particle TransportMonte Carlo Transport SimulationRadiation EffectsRadiation-hardened MemoryRadiation-hardened Memory DevicesSingle Event Upset Modeling
Heavy ion irradiation was simulated using a Geant4 based Monte-Carlo transport code. Electronic and nuclear physics were used to generate statistical profiles of charge deposition in the sensitive volume of an SEU hardened SRAM. Simulation results show that materials external to the sensitive volume can affect the experimentally measured cross-section curve.
15
Stopping of energetic light ions in elemental matter
J. F. Ziegler · Journal of Applied Physics · 1999 · 480 citations
Computational method to estimate Single Event Upset rates in an accelerator environment
M. Huhtinen, F. Faccio · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2000 · 132 citations
Engineering, Computer Engineering, Electrical Engineering +13