Publication | Closed Access
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM
169
Citations
15
References
2005
Year
Charge DepositionIon ImplantationEngineeringNuclear PhysicsPhysicsHigh-energy Nuclear ReactionNatural SciencesHeavy Ion PhysicApplied PhysicsRadiation TransportNuclear ReactionsHigh-density SeuCosmic RayHeavy Ion IrradiationIon BeamIon EmissionMicroelectronicsNuclear Engineering
Heavy ion irradiation was simulated using a Geant4 based Monte-Carlo transport code. Electronic and nuclear physics were used to generate statistical profiles of charge deposition in the sensitive volume of an SEU hardened SRAM. Simulation results show that materials external to the sensitive volume can affect the experimentally measured cross-section curve.
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