Michael L. Alles

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

Oluwole A. Amusan, Arthur F. Witulski, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2006 · 394 citations

Low-power Electronics, Hardware Security, Electrical Engineering +14

The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

Kevin M. Warren, Robert A. Weller, Marcus H. Mendenhall et al. · IEEE Transactions on Nuclear Science · 2005 · 169 citations

Charge Deposition, Ion Implantation, Engineering +15

A Bias-Dependent Single-Event Compact Model Implemented Into BSIM4 and a 90 nm CMOS Process Design Kit

J. S. Kauppila, A. Sternberg, Michael L. Alles et al. · IEEE Transactions on Nuclear Science · 2009 · 159 citations

Device Modeling, Electrical Engineering, Bsim4 Transistor Model +12

Radiation Effects in Advanced Multiple Gate and Silicon-on-Insulator Transistors

Eddy Simoen, Marc Gaillardin, Philippe Paillet et al. · IEEE Transactions on Nuclear Science · 2013 · 143 citations

Electrical Engineering, Planar Devices, Engineering +12

Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

Dennis R. Ball, John M. Hutson, Arto Javanainen et al. · IEEE Transactions on Nuclear Science · 2019 · 129 citations

Electrical Engineering, Engineering, Power Device +12