Michael L. Alles

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

Oluwole A. Amusan, Arthur F. Witulski, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2006 · 398 citations

Engineering, Computer Engineering, Electrical Engineering +11

The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

Kevin M. Warren, Robert A. Weller, Marcus H. Mendenhall et al. · IEEE Transactions on Nuclear Science · 2005 · 173 citations

Engineering, Electrical Engineering, Physics +17

A Bias-Dependent Single-Event Compact Model Implemented Into BSIM4 and a 90 nm CMOS Process Design Kit

J. S. Kauppila, A. Sternberg, Michael L. Alles et al. · IEEE Transactions on Nuclear Science · 2009 · 160 citations

Engineering, Computer Engineering, Electrical Engineering +15

Radiation Effects in Advanced Multiple Gate and Silicon-on-Insulator Transistors

Eddy Simoen, Marc Gaillardin, Philippe Paillet et al. · IEEE Transactions on Nuclear Science · 2013 · 149 citations

Engineering, Computer Engineering, Electrical Engineering +17

Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

Dennis R. Ball, John M. Hutson, Arto Javanainen et al. · IEEE Transactions on Nuclear Science · 2019 · 133 citations

Engineering, Electrical Engineering, Physics +17