L. W. Massengill

Basic mechanisms and modeling of single-event upset in digital microelectronics

P.E. Dodd, L. W. Massengill · IEEE Transactions on Nuclear Science · 2003 · 1.1K citations

Engineering, Computer Engineering, Electrical Engineering +17

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

Oluwole A. Amusan, Arthur F. Witulski, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2006 · 398 citations

Engineering, Computer Engineering, Electrical Engineering +11

Single Event Transients in Digital CMOS—A Review

V. Ferlet-Cavrois, L. W. Massengill, Pascale Gouker · IEEE Transactions on Nuclear Science · 2013 · 396 citations

Engineering, Computer Engineering, Computer Science +17

Monte Carlo Simulation of Single Event Effects

Robert A. Weller, Marcus H. Mendenhall, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2010 · 221 citations

Engineering, Electrical Engineering, Physics +16

The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

Kevin M. Warren, Robert A. Weller, Marcus H. Mendenhall et al. · IEEE Transactions on Nuclear Science · 2005 · 173 citations

Engineering, Electrical Engineering, Physics +17