Arthur F. Witulski - Concepedia

Author

Arthur F. Witulski

Also Known As

A. F. Witulski, A. Witulski, A.F Witulski, A.F. Witulski, Arthur F Witulski, Arthur F. Witulski, Arthur Witulski, Arthur. F. Witulski, Witulski, Arthur, Witulski, Arthur F.

165

Publications

6.5K

Citations

H-Index

119

Concepts

All Affiliations

Vanderbilt University University of Arizona University of Colorado Boulder Goddard Space Flight Center University of Jyväskylä

About

Arthur F. Witulski is an author at Vanderbilt University specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	38	85	6.2K
2	Applied Physics	22	27	3.1K
3	Education	3	3	183
4	Medicine	3	3	57
5	Natural Sciences	2	2	192

Arthur F. Witulski

Publications

6.2K

Citations

H-Index

Page 1

	Year	Citations
Ultrawide‐Bandgap Semiconductors: Research Opportunities and Challenges J. Y. Tsao, Srabanti Chowdhury, M.A. Hollis, Advanced Electronic Materials SemiconductorsWide-bandgap SemiconductorElectrical EngineeringElectronic DevicesUwbg Semiconductor Materials	2017	1.4K
Charge Collection and Charge Sharing in a 130 nm CMOS Technology Oluwole A. Amusan, Arthur F. Witulski, L. W. Massengill, IEEE Transactions on Nuclear Science Low-power ElectronicsHardware SecurityElectrical EngineeringSingle Event UpsetEngineering	2006	394
Large signal stability criteria for distributed systems with constant power loads Mohamed Belkhayat, R. Cooley, Arthur F. Witulski Constant Power LoadsEngineeringPower System DynamicsOptimal System DesignStability	2002	200
Comparison of resonant topologies in high-voltage DC applications Steven Johnson, Arthur F. Witulski, Robert W. Erickson IEEE Transactions on Aerospace and Electronic Systems Electrical EngineeringEngineeringHigh Voltage EngineeringPower DeviceParallel Topology	1988	184
Single-Event Burnout Mechanisms in SiC Power MOSFETs Arthur F. Witulski, Dennis R. Ball, K.F. Galloway, IEEE Transactions on Nuclear Science Electrical EngineeringExperimental DataEngineeringSemiconductor DeviceHigh Voltage Engineering	2018	175
Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies Balaji Narasimham, B. L. Bhuva, Ronald D. Schrimpf, IEEE Transactions on Nuclear Science EngineeringVlsi DesignNuclear PhysicsIon Beam InstrumentationIntegrated Circuits	2007	170
Introduction to modeling of transformers and coupled inductors Arthur F. Witulski IEEE Transactions on Power Electronics Magnetic Circuit ModelsElectrical EngineeringEngineeringPower Electronics ConverterCoupled Inductor	1995	156
On-Chip Characterization of Single-Event Transient Pulsewidths Balaji Narasimham, Vishwa Ramachandran, B. L. Bhuva, IEEE Transactions on Device and Materials Reliability Random Set PulsesElectrical EngineeringChip-scale PackageEngineeringVlsi Design	2006	146
Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes Dennis R. Ball, John M. Hutson, Arto Javanainen, IEEE Transactions on Nuclear Science Electrical EngineeringEngineeringPower DeviceNanoelectronicsBias Temperature Instability	2019	129
HBD layout isolation techniques for multiple node charge collection mitigation Jeffrey D. Black, Andrew L. Sternberg, Michael L. Alles, IEEE Transactions on Nuclear Science Device ModelingHardware SecurityElectrical EngineeringGuard ContactsEngineering	2005	122

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