Dennis R. Ball

Single-Event Burnout Mechanisms in SiC Power MOSFETs

Arthur F. Witulski, Dennis R. Ball, K.F. Galloway et al. · IEEE Transactions on Nuclear Science · 2018 · 179 citations · Full text

Engineering, Electrical Engineering, Microelectronics +16

The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

Kevin M. Warren, Robert A. Weller, Marcus H. Mendenhall et al. · IEEE Transactions on Nuclear Science · 2005 · 173 citations

Engineering, Electrical Engineering, Physics +17

Simultaneous single event charge sharing and parasitic bipolar conduction in a highly-scaled SRAM design

Brian D. Olson, Dennis R. Ball, Kevin M. Warren et al. · IEEE Transactions on Nuclear Science · 2005 · 155 citations

Engineering, Computer Engineering, Electrical Engineering +17

Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

Dennis R. Ball, John M. Hutson, Arto Javanainen et al. · IEEE Transactions on Nuclear Science · 2019 · 133 citations

Engineering, Electrical Engineering, Physics +17

Analysis of Parasitic PNP Bipolar Transistor Mitigation Using Well Contacts in 130 nm and 90 nm CMOS Technology

Brian D. Olson, Oluwole A. Amusan, Sandeepan DasGupta et al. · IEEE Transactions on Nuclear Science · 2007 · 107 citations

Engineering, Electrical Engineering, Circuit Theory +16