Arto Javanainen

SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

Andrea Coronetti, Matteo Cecchetto, Jialei Wang et al. · 2020 · 220 citations · Full text

Non-volatile Memory, Engineering, Vlsi Design +18

Single-Event Burnout Mechanisms in SiC Power MOSFETs

Arthur F. Witulski, Dennis R. Ball, K.F. Galloway et al. · IEEE Transactions on Nuclear Science · 2018 · 175 citations · Full text

Electrical Engineering, Experimental Data, Engineering +15

Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

Dennis R. Ball, John M. Hutson, Arto Javanainen et al. · IEEE Transactions on Nuclear Science · 2019 · 129 citations

Electrical Engineering, Engineering, Power Device +12

Single-Event Burnout of SiC Junction Barrier Schottky Diode High-Voltage Power Devices

Arthur F. Witulski, Robert Arslanbekov, Ashok Raman et al. · IEEE Transactions on Nuclear Science · 2017 · 102 citations

Electrical Engineering, Engineering, Physics +11

Heavy Ion Induced Degradation in SiC Schottky Diodes: Bias and Energy Deposition Dependence

Arto Javanainen, K.F. Galloway, Christopher Nicklaw et al. · IEEE Transactions on Nuclear Science · 2016 · 93 citations · Full text

Electrical Engineering, Sic Schottky Diodes, Engineering +14