Publication | Open Access
SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below
220
Citations
13
References
2020
Year
Unknown Venue
Non-volatile MemoryEngineeringVlsi DesignComputer ArchitectureMulti-channel Memory ArchitectureNanoelectronicsSuperconductivityElectronic PackagingHigh-energy ProtonsCustom-designed SramElectrical EngineeringPhysicsBias Temperature InstabilityComputer EngineeringSeu CharacterizationMicroelectronicsNm TechnologyApplied PhysicsR2e ProjectSemiconductor MemoryCustom-designed Srams
The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low- and high-energy protons, heavy ions, thermal, intermediate- and high-energy neutrons, high-energy electrons and high-energy pions.
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