Sandeepan DasGupta

Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM

Riaz Naseer, Y. Boulghassoul, Jeff Draper et al. · 2007 · 122 citations

Engineering, Computer Engineering, Electrical Engineering +13

Models and Algorithmic Limits for an ECC-Based Approach to Hardening Sub-100-nm SRAMs

Michael Bajura, Y. Boulghassoul, Riaz Naseer et al. · IEEE Transactions on Nuclear Science · 2007 · 114 citations

Engineering, Computer Engineering, Electrical Engineering +13

Analysis of Parasitic PNP Bipolar Transistor Mitigation Using Well Contacts in 130 nm and 90 nm CMOS Technology

Brian D. Olson, Oluwole A. Amusan, Sandeepan DasGupta et al. · IEEE Transactions on Nuclear Science · 2007 · 107 citations

Engineering, Electrical Engineering, Circuit Theory +16

3D heterogeneous integration of high performance high-K metal gate GaN NMOS and Si PMOS transistors on 300mm high-resistivity Si substrate for energy-efficient and compact power delivery, RF (5G and beyond) and SoC applications

Han Wui Then, Changyang Huang, B. Krist et al. · 2019 · 103 citations

Engineering, Electrical Engineering, Materials Science +17

Directional Sensitivity of Single Event Upsets in 90 nm CMOS Due to Charge Sharing

Oluwole A. Amusan, Lloyd W. Massengill, M.P. Baze et al. · IEEE Transactions on Nuclear Science · 2007 · 95 citations

Engineering, Computer Engineering, Electrical Engineering +14