M.P. Baze

Comparison of error rates in combinational and sequential logic

S. Büchner, M.P. Baze, David J. Brown et al. · IEEE Transactions on Nuclear Science · 1997 · 238 citations

Engineering, Verification, Computational Complexity +18

Attenuation of single event induced pulses in CMOS combinational logic

M.P. Baze, S. Büchner · IEEE Transactions on Nuclear Science · 1997 · 168 citations

Electrical Engineering, Long Logic Strings, Engineering +14

HBD layout isolation techniques for multiple node charge collection mitigation

Jeffrey D. Black, Andrew L. Sternberg, Michael L. Alles et al. · IEEE Transactions on Nuclear Science · 2005 · 122 citations

Device Modeling, Hardware Security, Electrical Engineering +13

A digital CMOS design technique for SEU hardening

M.P. Baze, S. Büchner, Dale McMorrow · IEEE Transactions on Nuclear Science · 2000 · 121 citations

Hardware Security, Electrical Engineering, Physical Design (Electronics) +12

Single Event Upsets in Deep-Submicrometer Technologies Due to Charge Sharing

Oluwole A. Amusan, L. W. Massengill, M.P. Baze et al. · IEEE Transactions on Device and Materials Reliability · 2008 · 108 citations

Hardware Security, Single Event Upsets, Electrical Engineering +15