M.P. Baze

Comparison of error rates in combinational and sequential logic

S. Büchner, M.P. Baze, David J. Brown et al. · IEEE Transactions on Nuclear Science · 1997 · 241 citations

Engineering, Computer Engineering, Electrical Engineering +14

Attenuation of single event induced pulses in CMOS combinational logic

M.P. Baze, S. Büchner · IEEE Transactions on Nuclear Science · 1997 · 168 citations

Engineering, Computer Engineering, Electrical Engineering +17

HBD layout isolation techniques for multiple node charge collection mitigation

Jeffrey D. Black, Andrew L. Sternberg, Michael L. Alles et al. · IEEE Transactions on Nuclear Science · 2005 · 123 citations

Engineering, Computer Engineering, Electrical Engineering +15

A digital CMOS design technique for SEU hardening

M.P. Baze, S. Büchner, Dale McMorrow · IEEE Transactions on Nuclear Science · 2000 · 121 citations

Engineering, Computer Engineering, Electrical Engineering +17

Single Event Upsets in Deep-Submicrometer Technologies Due to Charge Sharing

Oluwole A. Amusan, L. W. Massengill, M.P. Baze et al. · IEEE Transactions on Device and Materials Reliability · 2008 · 109 citations

Engineering, Electrical Engineering, Fault-tolerant Computing +7