S. Büchner

Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies

Joseph S. Melinger, S. Büchner, Dale McMorrow et al. · IEEE Transactions on Nuclear Science · 1994 · 260 citations · Full text

Natural Sciences, Materials Science, Physics +14

Subbandgap laser-induced single event effects: carrier generation via two-photon absorption

Dale McMorrow, William T. Lotshaw, Joseph S. Melinger et al. · IEEE Transactions on Nuclear Science · 2002 · 252 citations

Engineering, Electrical Engineering, Materials Science +17

Comparison of error rates in combinational and sequential logic

S. Büchner, M.P. Baze, David J. Brown et al. · IEEE Transactions on Nuclear Science · 1997 · 241 citations

Engineering, Computer Engineering, Electrical Engineering +14

Attenuation of single event induced pulses in CMOS combinational logic

M.P. Baze, S. Büchner · IEEE Transactions on Nuclear Science · 1997 · 168 citations

Engineering, Computer Engineering, Electrical Engineering +17

Pulsed-Laser Testing for Single-Event Effects Investigations

S. Büchner, F. Miller, V. Pouget et al. · IEEE Transactions on Nuclear Science · 2013 · 168 citations

Engineering, Electrical Engineering, Physics +12