F. Miller

Pulsed-Laser Testing for Single-Event Effects Investigations

S. Büchner, F. Miller, V. Pouget et al. · IEEE Transactions on Nuclear Science · 2013 · 168 citations

Engineering, Electrical Engineering, Physics +12

Sensitive Volume and Triggering Criteria of SEB in Classic Planar VDMOS

Aurore Luu, Patrick Austin, F. Miller et al. · IEEE Transactions on Nuclear Science · 2010 · 66 citations

Engineering, Computer Engineering, Electrical Engineering +15

Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL

S. Büchner, Nicolas J.-H. Roche, Jeffrey H. Warner et al. · IEEE Transactions on Nuclear Science · 2012 · 51 citations

Engineering, Electrical Engineering, Microelectronics +16

Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment

Thiago Santini, S. Morand, Mitra Fouladirad et al. · Microelectronics Reliability · 2014 · 50 citations

Engineering, Electrical Engineering, Materials Engineering +15

Gate oxide reliability assessment of a SiC MOSFET for high temperature aeronautic applications

Thomas Santini, S. Morand, F. Miller et al. · 2013 · 48 citations

Engineering, Aerospace Engineering, Electrical Engineering +17