Pulsed-Laser Testing for Single-Event Effects Investigations

S. Büchner, F. Miller, V. Pouget, +1

IEEE Transactions on Nuclear Science

Pulsed-laser TestingPhotonicsElectrical EngineeringPulsed LasersEngineering +12

Sensitive Volume and Triggering Criteria of SEB in Classic Planar VDMOS

Aurore Luu, Patrick Austin, F. Miller, +6

IEEE Transactions on Nuclear Science

Device ModelingSeb MechanismElectrical EngineeringPhysical Design (Electronics)Engineering +8

Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL

S. Büchner, Nicolas J.-H. Roche, Jeffrey H. Warner, +11

IEEE Transactions on Nuclear Science

EngineeringMeasurementLaser-plasma InteractionEducationOptical Properties +14

Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment

Thiago Santini, S. Morand, Mitra Fouladirad, +5

Microelectronics Reliability

Electrical EngineeringReliability EngineeringEngineeringLife PredictionPower Semiconductor Device +7

Gate oxide reliability assessment of a SiC MOSFET for high temperature aeronautic applications

Thomas Santini, S. Morand, F. Miller, +2

EngineeringElectrical AircraftQualification ProcessReliability EngineeringNanoelectronics +15

Characterization of Single-Event Burnout in Power MOSFET Using Backside Laser Testing

F. Miller, A. Luu, F. Prud'homme, +4

IEEE Transactions on Nuclear Science

Electrical EngineeringEngineeringHardware ReliabilityLaser-induced BreakdownBias Temperature Instability +9

Effects of beam spot size on the correlation between laser and heavy ion SEU testing

F. Miller, N. Buard, T. Carrière, +6

IEEE Transactions on Nuclear Science

PhysicsMeasurementThreshold EnergySpectroscopyNatural Sciences +10

Contribution of Thermal Neutrons to Soft Error Rate

C. Weulersse, Sabrine Houssany, N. Guibbaud, +4

IEEE Transactions on Nuclear Science

EngineeringNuclear PhysicsNuclear DataNuclear MaterialsThermodynamics +14

SEB Characterization of Commercial Power MOSFETs With Backside Laser and Heavy Ions of Different Ranges

Aurore Luu, F. Miller, P. Poirot, +6

IEEE Transactions on Nuclear Science

Seb CharacterizationBackside LaserElectrical EngineeringHigh-energy Heavy IonEngineering +11

Laser Mapping of SRAM Sensitive Cells: A Way to Obtain Input Parameters for DASIE Calculation Code

F. Miller, N. Buard, G. Hubert, +7

IEEE Transactions on Nuclear Science

Different Sensitive AreasEngineeringMeasurementLaser ApplicationsEducation +22