Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment

Thiago Santini, S. Morand, Mitra Fouladirad, Luong Viêt Phung, F. Miller, B. Foucher, Antoine Grall, Bruno Allard

Microelectronics Reliability · 2014 · 50 citations · 15 references

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