Luong Viêt Phung

Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment

Thiago Santini, S. Morand, Mitra Fouladirad et al. · Microelectronics Reliability · 2014 · 49 citations

Electrical Engineering, Reliability Engineering, Engineering +9

Gate oxide reliability assessment of a SiC MOSFET for high temperature aeronautic applications

Thomas Santini, S. Morand, F. Miller et al. · 2013 · 48 citations

Engineering, Electrical Aircraft, Qualification Process +17

Recent review on failures in silicon carbide power MOSFETs

Divine Khan Ngwashi, Luong Viêt Phung · Microelectronics Reliability · 2021 · 34 citations

Electrical Engineering, Engineering, Power Device +5

Characterization of m-GaN and a-GaN Crystallographic Planes after Being Chemically Etched in TMAH Solution

Nedal Al Taradeh, Éric Frayssinet, Christophe Rodriguez et al. · Energies · 2021 · 25 citations · Full text

Wide-bandgap Semiconductor, A-gan Crystallographic Planes, Engineering +18

Simulation-Based Study About the Lifetime and Incident Light Properties Dependence of the Optically Triggered 4H-SiC Thyristors Operation

Junichi Hasegawa, Loris Pace, Luong Viêt Phung et al. · IEEE Transactions on Electron Devices · 2017 · 21 citations · Full text

Photonics, Electrical Engineering, Solid-state Lighting +15