B. Foucher

Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics

Estelle Scanff, Kiri Feldman, Samir Ghelam et al. · Microelectronics Reliability · 2007 · 95 citations

Architecture, Pharmacoeconomics, Cost-utility Analysis +15

Backside SEU laser testing for commercial off-the-shelf SRAMs

F. Darracq, H. Lapuyade, N. Buard et al. · IEEE Transactions on Nuclear Science · 2002 · 52 citations

Engineering, Computer Engineering, Electrical Engineering +13

Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment

Thiago Santini, S. Morand, Mitra Fouladirad et al. · Microelectronics Reliability · 2014 · 50 citations

Engineering, Electrical Engineering, Materials Engineering +15

Why a new parts selection and management program?

B. Foucher, Ross Kenneth Kennedy, N. Kelkar et al. · IEEE Transactions on Components Packaging and Manufacturing Technology Part A · 1998 · 20 citations

Management, Operations Management, Supply Chain Management +10

Development and use of a miniaturized health monitoring device

Vincent Rouet, B. Foucher · 2004 · 15 citations

Engineering, Environmental Engineering, Systems Engineering +13