IEEE Transactions on Nuclear Science · 2002 · 52 citations · 7 references
EngineeringComputer EngineeringElectrical EngineeringInstrumentationMicroelectronicsSemiconductor DevicesBuilt-in Self-testDesign For TestabilityDevice CharacterizationDevice ReliabilitySemiconductor LasersSemiconductor ReliabilityExperimental Results InterpretationLaser Fault InjectionLaser-based DiagnosticsTest Bench Design
This paper presents a new methodology for single-event upset laser testing of commercial off-the-shelf SRAMs. This methodology is based on backside laser test and is illustrated with some experimental results obtained with a new dedicated laser test bench.
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Optical absorption in heavily doped silicon
P. E. Schmid · Physical review. B, Condensed matter · 1981 · 256 citations