M.-C. Calvet

Device simulation study of the SEU sensitivity of SRAMs to internal ion tracks generated by nuclear reactions

J.M. Palau, G. Hubert, K. Coulié et al. · IEEE Transactions on Nuclear Science · 2001 · 125 citations

Engineering, Computer Engineering, Electrical Engineering +14

Simulation of nucleon-induced nuclear reactions in a simplified SRAM structure: scaling effects on SEU and MBU cross sections

F. Wrobel, J.M. Palau, M.-C. Calvet et al. · IEEE Transactions on Nuclear Science · 2001 · 83 citations

Natural Sciences, Computer Engineering, Physics +15

Incidence of multi-particle events on soft error rates caused by n-Si nuclear reactions

F. Wrobel, J.M. Palau, M.-C. Calvet et al. · IEEE Transactions on Nuclear Science · 2000 · 65 citations

Natural Sciences, Physics, Nuclear Physics +12

Detailed analysis of secondary ions' effect for the calculation of neutron-induced SER in SRAMs

G. Hubert, J.M. Palau, K. Castellani-Coulié et al. · IEEE Transactions on Nuclear Science · 2001 · 62 citations

Engineering, Electrical Engineering, Physics +8

Backside SEU laser testing for commercial off-the-shelf SRAMs

F. Darracq, H. Lapuyade, N. Buard et al. · IEEE Transactions on Nuclear Science · 2002 · 52 citations

Engineering, Computer Engineering, Electrical Engineering +13