F. Wrobel - Concepedia

Author

F. Wrobel

Also Known As

F Wrobel, F. Saigne, F. Wrobel, Frderic Wrobel, Frdric Wrobel, Frederic Saigne, Frederic WROBEL, Frederic Wrobel, FrÉdÉric Wrobel, Frédéric WROBEL

304

Publications

2.5K

Citations

H-Index

106

Concepts

All Affiliations

Université de Montpellier Centre National de la Recherche Scientifique Institut d'Électronique et des Systèmes Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier European Organization for Nuclear Research

About

F. Wrobel is an author at Université de Montpellier specializing in engineering, microelectronics, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	26	58	1.8K
2	Natural Sciences	14	19	708
3	Health Sciences	3	3	41
4	Medicine	2	2	84
5	Education	1	1	16

F. Wrobel

Publications

1.9K

Citations

H-Index

Page 1

	Year	Citations
Characterization of an SRAM based particle detector for mixed-field radiation environments Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Particle FluenceEngineeringMeasurementMixed-field Radiation EnvironmentsH4irrad Test Facility	2013	195
Simulation of nucleon-induced nuclear reactions in a simplified SRAM structure: scaling effects on SEU and MBU cross sections F. Wrobel, J.M. Palau, M.-C. Calvet, IEEE Transactions on Nuclear Science EngineeringComputer ArchitectureSimplified Sram StructureMulti-channel Memory ArchitectureMemory Device	2001	82
Criterion for SEU occurrence in SRAM deduced from circuit and device Simulations in case of neutron-induced SER T. Mérelle, H. Chabane, J.M. Palau, IEEE Transactions on Nuclear Science EngineeringSeu OccurrenceIon ImplantationPlasma ElectronicsReliable Criterion	2005	73
Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects Robert A. Reed, Robert A. Weller, A. Akkerman, IEEE Transactions on Nuclear Science Radiation Transport ToolsEngineeringRadiation ExposureMonte Carlo MethodsSingle-particle Induced Failures	2013	65
Incidence of multi-particle events on soft error rates caused by n-Si nuclear reactions F. Wrobel, J.M. Palau, M.-C. Calvet, IEEE Transactions on Nuclear Science Neutron ReactionsEngineeringNuclear PhysicsPhysicsN-si Nuclear Reactions	2000	65
Multiple Cell Upset Classification<newline/> in Commercial SRAMs Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, IEEE Transactions on Nuclear Science Hardware SecurityNm SramElectrical EngineeringCommercial SramsEngineering	2014	59
Dose rate effects in bipolar oxides: Competition between trap filling and recombination J. Boch, Frédéric Saigné, Antoine Touboul, Applied Physics Letters EngineeringRadiation EffectBipolar TechnologiesRadiation ExposureChemistry	2006	58
Determining Realistic Parameters for the <newline/> Double Exponential Law that Models<newline/> Transient Current Pulses F. Wrobel, Luigi Dilillo, Antoine Touboul, IEEE Transactions on Nuclear Science Device ModelingElectrical EngineeringSingle Event UpsetEngineeringPhysics	2014	56
MC-ORACLE: A tool for predicting Soft Error Rate F. Wrobel, Frédéric Saigné Computer Physics Communications Reliability EngineeringEngineeringProgram AnalysisPredictive AnalyticsSoftware Testing	2010	54
Neutron-Induced Failure in Silicon IGBTs, Silicon Super-Junction and SiC MOSFETs Alessio Griffoni, Jeroen van Duivenbode, Dimitri Linten, IEEE Transactions on Nuclear Science Device TypeElectrical EngineeringEngineeringPower DeviceMev Neutron-induced Failure	2012	50

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