J.M. Palau

Single particle-induced latchup

G. Bruguier, J.M. Palau · IEEE Transactions on Nuclear Science · 1996 · 144 citations

Engineering, Electrical Engineering, Physics +17

Determination of key parameters for SEU occurrence using 3-D full cell SRAM simulations

Ph. Roche, J.M. Palau, G. Bruguier et al. · IEEE Transactions on Nuclear Science · 1999 · 136 citations

Engineering, Computer Engineering, Electrical Engineering +17

Device simulation study of the SEU sensitivity of SRAMs to internal ion tracks generated by nuclear reactions

J.M. Palau, G. Hubert, K. Coulié et al. · IEEE Transactions on Nuclear Science · 2001 · 125 citations

Engineering, Computer Engineering, Electrical Engineering +14

SEGR and SEB in n-channel power MOSFETs

M. Allenspach, C. Dachs, G.H. Johnson et al. · IEEE Transactions on Nuclear Science · 1996 · 91 citations

Engineering, Electrical Engineering, Electronic Materials +16

Simulation of nucleon-induced nuclear reactions in a simplified SRAM structure: scaling effects on SEU and MBU cross sections

F. Wrobel, J.M. Palau, M.-C. Calvet et al. · IEEE Transactions on Nuclear Science · 2001 · 83 citations

Natural Sciences, Computer Engineering, Physics +15