C. Dachs

Layout techniques to enhance the radiation tolerance of standard CMOS technologies demonstrated on a pixel detector readout chip

W. Snoeys, F. Faccio, Michael J. Burns et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2000 · 168 citations · Full text

Radiation Tolerance, Electrical Engineering, Engineering +11

SEGR and SEB in n-channel power MOSFETs

M. Allenspach, C. Dachs, G.H. Johnson et al. · IEEE Transactions on Nuclear Science · 1996 · 91 citations

Hardware Security, Electrical Engineering, Reliability Engineering +15

SEU critical charge and sensitive area in a submicron CMOS technology

C. Detcheverry, C. Dachs, E. Lorfèvre et al. · IEEE Transactions on Nuclear Science · 1997 · 79 citations

Low-power Electronics, Non-volatile Memory, Electrical Engineering +15

Evidence of the ion's impact position effect on SEB in N-channel power MOSFETs

C. Dachs, F. Roubaud, J.M. Palau et al. · IEEE Transactions on Nuclear Science · 1994 · 59 citations

Device Modeling, Electrical Engineering, Impact Position Effect +13

CMOS device optimization for mixed-signal technologies

P.A. Stolk, Hans Tuinhout, Ray Duffy et al. · 2002 · 58 citations

Electrical Engineering, Engineering, Vlsi Design +12