T. Mérelle

Criterion for SEU occurrence in SRAM deduced from circuit and device Simulations in case of neutron-induced SER

T. Mérelle, H. Chabane, J.M. Palau et al. · IEEE Transactions on Nuclear Science · 2005 · 74 citations

Engineering, Computer Engineering, Electrical Engineering +17

Monte-Carlo simulations to quantify neutron-induced multiple bit upsets in advanced SRAMs

T. Mérelle, Frédéric Saigné, B. Sagnes et al. · IEEE Transactions on Nuclear Science · 2005 · 45 citations

Engineering, Computer Engineering, Electrical Engineering +11

Matching Performance of FinFET Devices With Fin Widths Down to 10 nm

Paolo Magnone, A. Mercha, V. Subramanian et al. · IEEE Electron Device Letters · 2009 · 35 citations

Engineering, Electrical Engineering, Microelectronics +16

CMOS biosensor platform

F. Widdershoven, David Van Steenwinckel, J. Uberfeld et al. · 2010 · 29 citations

Engineering, Bioengineering, Biomedical Engineering +17

First observation of FinFET specific mismatch behavior and optimization guidelines for SRAM scaling

T. Mérelle, G. Curatola, A. Nackaerts et al. · 2008 · 25 citations

Engineering, Computer Engineering, Electrical Engineering +17