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Review on high-k dielectrics reliability issues
G. Ribes, Jérôme Mitard, M. Denais et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 523 citations
T. Skotnicki, J.A. Hutchby, Tsu‐Jae King et al. · IEEE Circuits and Devices Magazine · 2005 · 441 citations
Engineering, Computer Engineering, Electrical Engineering +17
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