Jérôme Mitard

Review on high-k dielectrics reliability issues

G. Ribes, Jérôme Mitard, M. Denais et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 523 citations

Engineering, Electrical Engineering, Materials Science +17

Germanium MOSFET Devices: Advances in Materials Understanding, Process Development, and Electrical Performance

D.P. Brunco, Brice De Jaeger, Geert Eneman et al. · Journal of The Electrochemical Society · 2008 · 265 citations

Engineering, Materials Engineering, Materials Science +17

Capacitor-less, Long-Retention (>400s) DRAM Cell Paving the Way towards Low-Power and High-Density Monolithic 3D DRAM

Attilio Belmonte, Hyungrock Oh, Nouredine Rassoul et al. · 2020 · 194 citations

Engineering, Electrical Engineering, Materials Science +16

Carrier transport in HfO/sub 2//metal gate MOSFETs: physical insight into critical parameters

M. Cassé, L. Thévenod, B. Guillaumot et al. · IEEE Transactions on Electron Devices · 2006 · 131 citations

Engineering, Electrical Engineering, Physics +17

Characterization and modeling of hysteresis phenomena in high K dielectrics

C. Leroux, Jérôme Mitard, G. Ghibaud et al. · 2005 · 107 citations

Engineering, Electrical Engineering, Materials Engineering +17