C. Parthasarathy

Review on high-k dielectrics reliability issues

G. Ribes, Jérôme Mitard, M. Denais et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 519 citations

Dielectrics, Engineering, Semiconductor Device +16

NBTI degradation: From physical mechanisms to modelling

V. Huard, M. Denais, C. Parthasarathy · Microelectronics Reliability · 2005 · 498 citations

Engineering, Physics, Bias Temperature Instability +5

A thorough investigation of MOSFETs NBTI degradation

V. Huard, M. Denais, F. Perrier et al. · Microelectronics Reliability · 2004 · 147 citations

Electrical Engineering, Engineering, Bias Temperature Instability +4

NBTI degradation: From transistor to SRAM arrays

V. Huard, C. Parthasarathy, C. Guérin et al. · 2008 · 146 citations

Device Modeling, Sram Bitcell, Electrical Engineering +12

Interface Trap Generation and Hole Trapping Under NBTI and PBTI in Advanced CMOS Technology With a 2-nm Gate Oxide

M. Denais, V. Huard, C. Parthasarathy et al. · IEEE Transactions on Device and Materials Reliability · 2004 · 122 citations

Electrical Engineering, Engineering, Advanced Cmos Technology +13