Concepedia

Publication | Closed Access

A thorough investigation of MOSFETs NBTI degradation

DOI

147

Citations

19

References

2004

Year

V. Huard, M. Denais, F. Perrier, N. Revil, C. Parthasarathy, A. Bravaix, Emmanuel Vincent
Microelectronics Reliability

References

YearCitations

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