F. Perrier

A thorough investigation of MOSFETs NBTI degradation

V. Huard, M. Denais, F. Perrier et al. · Microelectronics Reliability · 2004 · 150 citations

Engineering, Electrical Engineering, Electronic Materials +13

Interface Trap Generation and Hole Trapping Under NBTI and PBTI in Advanced CMOS Technology With a 2-nm Gate Oxide

M. Denais, V. Huard, C. Parthasarathy et al. · IEEE Transactions on Device and Materials Reliability · 2004 · 122 citations

Engineering, Electrical Engineering, Microelectronics +16

Paradigm Shift for NBTI Characterization in Ultra-Scaled CMOS Technologies

M. Denais, A. Bravaix, V. Huard et al. · 2006 · 31 citations

Engineering, Computer Engineering, Electrical Engineering +17

Designing in reliability in advanced CMOS technologies

C. Parthasarathy, M. Denais, V. Huard et al. · Microelectronics Reliability · 2006 · 29 citations

Engineering, Computer Engineering, Electrical Engineering +12

New perspectives on NBTI in advanced technologies: modelling & characterization

M. Denais, V. Huard, C. Parthasarathy et al. · 2005 · 19 citations

Engineering, Electrical Engineering, Electronic Materials +16