Statistics
Publications
58
Citations
2.1K
H-Index
23
Active since
1993
A. Bravaix is an author at Institut Supérieur de l'Électronique et du Numérique specializing in microelectronics, engineering, and electrical engineering.
Publications per year
1993–2022
58
58
On-the-flycharacterization of NBTI in ultra-tihin gate oxide PMOSFET's
M. Denais, A. Bravaix, V. Huard et al. · 2005 · 234 citations
A thorough investigation of MOSFETs NBTI degradation
V. Huard, M. Denais, F. Perrier et al. · Microelectronics Reliability · 2004 · 147 citations
Electrical Engineering, Engineering, Bias Temperature Instability +4
1–5 of 58