C. Guérin

Improved amorphous/crystalline silicon interface passivation by hydrogen plasma treatment

Antoine Descoeudres, Loris Barraud, Stefaan De Wolf et al. · Applied Physics Letters · 2011 · 271 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Hot-Carrier acceleration factors for low power management in DC-AC stressed 40nm NMOS node at high temperature

A. Bravaix, C. Guérin, V. Huard et al. · 2009 · 178 citations

Engineering, Electrical Engineering, Low-power Design +16

NBTI degradation: From transistor to SRAM arrays

V. Huard, C. Parthasarathy, C. Guérin et al. · 2008 · 147 citations

Engineering, Computer Engineering, Electrical Engineering +13

General framework about defect creation at the Si∕SiO2 interface

C. Guérin, V. Huard, A. Bravaix · Journal of Applied Physics · 2009 · 141 citations · Full text

Engineering, Materials Engineering, Materials Science +17

The Energy-Driven Hot-Carrier Degradation Modes of nMOSFETs

C. Guérin, Vincent Huard, A. Bravaix · IEEE Transactions on Device and Materials Reliability · 2007 · 123 citations

Engineering, Electrical Engineering, Physics +17