Designing in reliability in advanced CMOS technologies

Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling

G. Chen, M.F. Li, C. H. Ang et al. · IEEE Electron Device Letters · 2002 · 163 citations

Engineering, Electrical Engineering, Microelectronics +16

A thorough investigation of MOSFETs NBTI degradation

V. Huard, M. Denais, F. Perrier et al. · Microelectronics Reliability · 2004 · 150 citations

Engineering, Electrical Engineering, Electronic Materials +13

Hot-carrier and soft-breakdown effects on VCO performance

Enjun Xiao, J.S. Yuan, Hong Yang · IEEE Transactions on Microwave Theory and Techniques · 2002 · 59 citations · Full text

Engineering, Electrical Engineering, Analog Electronics +15

Circuit design guidelines for n-channel MOSFET hot carrier robustness

K. Mistry, T.F. Fox, R.P. Preston et al. · IEEE Transactions on Electron Devices · 1993 · 48 citations

Engineering, Computer Engineering, Electrical Engineering +17

New Insights into Recovery Characteristics Post NBTI Stress

CR Parthasarathy, M. Denais, V. Huard et al. · 2006 · 38 citations

Engineering, Materials Science, Semiconductor Devices +10