N. Revil

On-the-flycharacterization of NBTI in ultra-tihin gate oxide PMOSFET's

M. Denais, A. Bravaix, V. Huard et al. · 2005 · 235 citations

Engineering, Electrical Engineering, Electronic Materials +16

A thorough investigation of MOSFETs NBTI degradation

V. Huard, M. Denais, F. Perrier et al. · Microelectronics Reliability · 2004 · 150 citations

Engineering, Electrical Engineering, Electronic Materials +13

0.13 $\mu$m SiGe BiCMOS Technology Fully Dedicated to mm-Wave Applications

G. Avenier, Malick Diop, P. Chevalier et al. · IEEE Journal of Solid-State Circuits · 2009 · 139 citations

Engineering, Electrical Engineering, Microelectronics +13

Interface Trap Generation and Hole Trapping Under NBTI and PBTI in Advanced CMOS Technology With a 2-nm Gate Oxide

M. Denais, V. Huard, C. Parthasarathy et al. · IEEE Transactions on Device and Materials Reliability · 2004 · 122 citations

Engineering, Electrical Engineering, Microelectronics +16

A functional 0.69 μm/sup 2/ embedded 6T-SRAM bit cell for 65 nm CMOS platform

F. Arnaud, F. Salvetti, D. Lenoble et al. · 2004 · 30 citations

Engineering, Computer Engineering, Electrical Engineering +17