Concepedia
Microelectronics Reliability · 2005 · 503 citations · 16 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice ModelingMaterial DegradationSemiconductor ReliabilityDegradation AnalysisDevice DegradationReliability DegradationReliability Degradation MechanismsWear-out Mechanisms
16
Negative bias temperature instability: Road to cross in deep submicron silicon semiconductor manufacturing
D.K. Schroder, Jeff A. Babcock · Journal of Applied Physics · 2003 · 1K citations
Engineering, Electrical Engineering, Physics +17
Impact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon
D. J. DiMaria, E. Cartier, D. Arnold · Journal of Applied Physics · 1993 · 716 citations
Engineering, Materials Engineering, Materials Science +17
Characteristics of the Surface-State Charge (Qss) of Thermally Oxidized Silicon
B. E. Deal, Michael C. Sklar, Andrew S. Grove et al. · Journal of The Electrochemical Society · 1967 · 708 citations
Negative bias stress of MOS devices at high electric fields and degradation of MNOS devices
Kjell Jeppson, Christer Svensson · Journal of Applied Physics · 1977 · 678 citations · Full text
Engineering, Electrical Engineering, Materials Science +14
Mechanism of negative-bias-temperature instability
C. E. Blat, E. H. Nicollian, Edward H. Poindexter · Journal of Applied Physics · 1991 · 242 citations
Natural Sciences, Electrical Engineering, Materials Science +17