T. Skotnicki

The end of CMOS scaling

T. Skotnicki, J.A. Hutchby, Tsu‐Jae King et al. · IEEE Circuits and Devices Magazine · 2005 · 441 citations

Engineering, Computer Engineering, Electrical Engineering +17

Plasma wave detection of terahertz radiation by silicon field effects transistors: Responsivity and noise equivalent power

R. Tauk, F. Teppe, S. Boubanga et al. · Applied Physics Letters · 2006 · 343 citations

Engineering, Electrical Engineering, Microelectronics +16

Broadband terahertz imaging with highly sensitive silicon CMOS detectors

F. Schuster, Dominique Coquillat, H. Videlier et al. · Optics Express · 2011 · 324 citations · Full text

Engineering, Electrical Engineering, Microelectronics +16

Plasma wave detection of sub-terahertz and terahertz radiation by silicon field-effect transistors

W. Knap, F. Teppe, Y. M. Meziani et al. · Applied Physics Letters · 2004 · 314 citations

Engineering, Electrical Engineering, Physics +17

Silicon-on-Nothing (SON)-an innovative process for advanced CMOS

M. Jurczak, T. Skotnicki, M. Paoli et al. · IEEE Transactions on Electron Devices · 2000 · 217 citations

Engineering, Electrical Engineering, Materials Science +17