R. Dufayel

Backside SEU laser testing for commercial off-the-shelf SRAMs

F. Darracq, H. Lapuyade, N. Buard et al. · IEEE Transactions on Nuclear Science · 2002 · 52 citations

Engineering, Computer Engineering, Electrical Engineering +13

Effects of beam spot size on the correlation between laser and heavy ion SEU testing

F. Miller, N. Buard, T. Carrière et al. · IEEE Transactions on Nuclear Science · 2004 · 46 citations

Natural Sciences, Nuclear Engineering, Physics +9

SEU induced by pions in memories from different generations

S. Duzellier, D. Falguère, M.G. Tverskoy et al. · IEEE Transactions on Nuclear Science · 2001 · 13 citations

Engineering, Computer Engineering, Electrical Engineering +15

Interest of laser test facility for the assessment of natural radiation environment effects on integrated circuits based systems

F. Miller, Aurélie Germain, Nutrition Board et al. · European Conference on Radiation and Its Effects on Components and Systems · 2003 · 13 citations

Engineering, Computer Engineering, Electrical Engineering +16