Publication | Closed Access
Interest of laser test facility for the assessment of natural radiation environment effects on integrated circuits based systems
13
Citations
3
References
2003
Year
EngineeringMeasurementLaser Test FacilityAnalog ComponentsIntegrated CircuitsInstrumentation EngineeringRadiation ProtectionCalibrationOptical DiagnosticsLaser-based SensorInstrumentationRadiation ImagingHealth SciencesElectrical EngineeringRadiation DetectionComputer EngineeringSingle Event EffectsRadiation ApplicationMicroelectronicsSet TestsElectronic Instrumentation
This paper presents the EADS-CCR’s industrial laser test facility dedicated to the investigation of Single Event Effects. Applications to sensitivity precharacterisation of lntegrated Circuits are presented with a focus on SET tests of analog components.
| Year | Citations | |
|---|---|---|
Page 1
Page 1