European Conference on Radiation and Its Effects on Components and Systems · 2003 · 13 citations · 3 references
EngineeringComputer EngineeringElectrical EngineeringAnalog ElectronicsInstrumentationMicroelectronicsBuilt-in Self-testDesign For TestabilityMixed-signal Integrated Circuit DesignMixed-signal IntegrationRadiation SensitivityAnalog IsolationBuilt-in Self-test For Analog CircuitsComponent-level Radiation TestingMixed-signal TestNatural Environment ExposureSingle Event EffectsSingle Event Upset ModelingValidation Of Integrated Circuits
This paper presents the EADS-CCR’s industrial laser test facility dedicated to the investigation of Single Event Effects. Applications to sensitivity precharacterisation of lntegrated Circuits are presented with a focus on SET tests of analog components.
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