T. Carrière

Total dose failures in advanced electronics from single ions

Timothy R. Oldham, K. W. Bennett, J. Beaucour et al. · IEEE Transactions on Nuclear Science · 1993 · 116 citations · Full text

Engineering, Total Dose Failures, Emerging Memory Technology +17

Total dose effects on negative voltage regulator

J. Beaucour, T. Carrière, A. Gach et al. · IEEE Transactions on Nuclear Science · 1994 · 99 citations

Engineering, Radiation Physics, Local Irradiation +21

Criterion for SEU occurrence in SRAM deduced from circuit and device Simulations in case of neutron-induced SER

T. Mérelle, H. Chabane, J.M. Palau et al. · IEEE Transactions on Nuclear Science · 2005 · 73 citations

Engineering, Seu Occurrence, Ion Implantation +18

Heavy ion induced single hard errors on submicronic memories (for space application)

Christian Dufour, Philippe Garnier, T. Carrière et al. · IEEE Transactions on Nuclear Science · 1992 · 49 citations

Radiation-induced Hard Errors, Engineering, Nuclear Physics +21

Characterization of Single-Event Burnout in Power MOSFET Using Backside Laser Testing

F. Miller, A. Luu, F. Prud'homme et al. · IEEE Transactions on Nuclear Science · 2006 · 48 citations

Electrical Engineering, Engineering, Hardware Reliability +11