Single Event Effects

Single Event Effects is a phenomenon in radiation-hardened electronics whereby a single high-energy particle strike induces transient or permanent malfunction in a microelectronic device through ionization leading to unintended signal changes, distinguished from cumulative radiation effects by its discrete and immediate nature.

1.4K

Publications

52.6K

Citations

3.5K

Authors

802

Institutions

Publications per year

2017–2026

261

Variants

See

Parents

Radiation Hardening

Publications

1.4K

Gamma-ray bursters at cosmological distances

B. Paczyński · The Astrophysical Journal · 1986 · 1.5K citations

Natural Sciences, Astronomy, Physics +14

Basic mechanisms and modeling of single-event upset in digital microelectronics

P.E. Dodd, L. W. Massengill · IEEE Transactions on Nuclear Science · 2003 · 1.1K citations

Engineering, Computer Engineering, Electrical Engineering +17

Previous Exposure to Trauma and PTSD Effects of Subsequent Trauma: Results From the Detroit Area Survey of Trauma

Naomi Breslau, Howard D. Chilcoat, Ronald C. Kessler et al. · American Journal of Psychiatry · 1999 · 918 citations

Medicine, Psychiatry, Psychology +14

Single event upset at ground level

E. Normand · IEEE Transactions on Nuclear Science · 1996 · 611 citations

Computing, Computer Engineering, Computer Systems +10

Characterization of soft errors caused by single event upsets in CMOS processes

Tanay Karnik, P. Hazucha · IEEE Transactions on Dependable and Secure Computing · 2004 · 540 citations

Engineering, Computer Engineering, Electrical Engineering +17

1–5 of 1.4K

Authors

3.5K

LW
L. W. Massengill
Vanderbilt University, United States
87 publications · 5.7K citations
39
h-index
RD
Ronald D. Schrimpf
Vanderbilt University, United States
69 publications · 3.7K citations
34
h-index
RA
Robert A. Reed
Vanderbilt University, United States
67 publications · 3K citations
33
h-index
BL
B. L. Bhuva
Vanderbilt University, United States
73 publications · 3.5K citations
33
h-index
SB
S. Büchner
United States Naval Research Laboratory, United States
64 publications · 2.7K citations
32
h-index

1–5 of 3.5K

Institutions

802

1–8 of 802

Venues

IEEE Transactions on Nuclear Science
608 publications · 28.2K citations
81
h-index
IEEE Transactions on Device and Materials Reliability
30 publications · 1.4K citations
18
h-index
Microelectronics Reliability
24 publications · 588 citations
15
h-index
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
15 publications · 321 citations
11
h-index
Electronics
8 publications · 134 citations
10
h-index

1–5