B. L. Bhuva

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

Oluwole A. Amusan, Arthur F. Witulski, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2006 · 394 citations

Low-power Electronics, Hardware Security, Electrical Engineering +14

Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies

Balaji Narasimham, B. L. Bhuva, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science · 2007 · 170 citations

Engineering, Vlsi Design, Nuclear Physics +21

Comparison of Combinational and Sequential Error Rates for a Deep Submicron Process

N. N. Mahatme, S. Jagannathan, T. D. Loveless et al. · IEEE Transactions on Nuclear Science · 2011 · 146 citations

Engineering, Vlsi Design, Computer Architecture +20

On-Chip Characterization of Single-Event Transient Pulsewidths

Balaji Narasimham, Vishwa Ramachandran, B. L. Bhuva et al. · IEEE Transactions on Device and Materials Reliability · 2006 · 146 citations

Random Set Pulses, Electrical Engineering, Chip-scale Package +12

Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits

Jonathan R. Ahlbin, L. W. Massengill, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2009 · 144 citations

Electrical Engineering, Heavy-ion Broad-beam Experiments, Engineering +12