B. L. Bhuva

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

Oluwole A. Amusan, Arthur F. Witulski, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2006 · 398 citations

Engineering, Computer Engineering, Electrical Engineering +11

Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies

Balaji Narasimham, B. L. Bhuva, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science · 2007 · 170 citations

Engineering, Computer Engineering, Electrical Engineering +15

Comparison of Combinational and Sequential Error Rates for a Deep Submicron Process

N. N. Mahatme, S. Jagannathan, T. D. Loveless et al. · IEEE Transactions on Nuclear Science · 2011 · 147 citations

Engineering, Computer Engineering, Electrical Engineering +17

On-Chip Characterization of Single-Event Transient Pulsewidths

Balaji Narasimham, Vishwa Ramachandran, B. L. Bhuva et al. · IEEE Transactions on Device and Materials Reliability · 2006 · 147 citations

Engineering, Computer Engineering, Electrical Engineering +12

Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits

Jonathan R. Ahlbin, L. W. Massengill, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2009 · 144 citations

Engineering, Electrical Engineering, Microelectronics +11