Jonathan R. Ahlbin

Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits

Jonathan R. Ahlbin, L. W. Massengill, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2009 · 144 citations

Electrical Engineering, Heavy-ion Broad-beam Experiments, Engineering +12

The Effect of Layout Topology on Single-Event Transient Pulse Quenching in a 65 nm Bulk CMOS Process

Jonathan R. Ahlbin, Matthew J. Gadlage, Dennis R. Ball et al. · IEEE Transactions on Nuclear Science · 2010 · 97 citations

Pmos Transistors, Electrical Engineering, Physical Design (Electronics) +15

Layout Technique for Single-Event Transient Mitigation via Pulse Quenching

N. M. Atkinson, Arthur F. Witulski, W.T. Holman et al. · IEEE Transactions on Nuclear Science · 2011 · 96 citations

Engineering, Vlsi Design, Logic Cells +17

Design Techniques to Reduce SET Pulse Widths in Deep-Submicron Combinational Logic

Oluwole A. Amusan, L. W. Massengill, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2007 · 94 citations

Engineering, Vlsi Design, Computer Architecture +19

Effect of Well and Substrate Potential Modulation on Single Event Pulse Shape in Deep Submicron CMOS

Sandeepan DasGupta, Arthur F. Witulski, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2007 · 91 citations

Engineering, Vlsi Design, Quantitative Circuit +16