N. M. Atkinson

Layout Technique for Single-Event Transient Mitigation via Pulse Quenching

N. M. Atkinson, Arthur F. Witulski, W.T. Holman et al. · IEEE Transactions on Nuclear Science · 2011 · 96 citations

Engineering, Vlsi Design, Logic Cells +17

Effect of Multiple-Transistor Charge Collection on Single-Event Transient Pulse Widths

Jonathan R. Ahlbin, Matthew J. Gadlage, N. M. Atkinson et al. · IEEE Transactions on Device and Materials Reliability · 2011 · 56 citations

Device Modeling, Electrical Engineering, Physical Design (Electronics) +10

Effect of Transistor Density and Charge Sharing on Single-Event Transients in 90-nm Bulk CMOS

N. M. Atkinson, Jonathan R. Ahlbin, Arthur F. Witulski et al. · IEEE Transactions on Nuclear Science · 2011 · 54 citations

Device Modeling, Low-power Electronics, Electrical Engineering +15

On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology

T. D. Loveless, J. S. Kauppila, S. Jagannathan et al. · IEEE Transactions on Nuclear Science · 2012 · 50 citations

Engineering, Vlsi Design, Measurement +18

Finite element method for 3D eddy current flow in thin conducting sheets

D. Rodger, N. M. Atkinson · IEE Proceedings A Physical Science Measurement and Instrumentation Management and Education Reviews · 1988 · 43 citations

Numerical Analysis, Finite Element Method, Electrical Engineering +15