Matthew J. Gadlage

Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies

Balaji Narasimham, B. L. Bhuva, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science · 2007 · 170 citations

Engineering, Computer Engineering, Electrical Engineering +15

Single event transient pulse widths in digital microcircuits

Matthew J. Gadlage, Ronald D. Schrimpf, J.M. Benedetto et al. · IEEE Transactions on Nuclear Science · 2004 · 146 citations

Engineering, Computer Engineering, Electrical Engineering +14

Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits

Jonathan R. Ahlbin, L. W. Massengill, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2009 · 144 citations

Engineering, Electrical Engineering, Microelectronics +11

Digital Single Event Transient Trends With Technology Node Scaling

J.M. Benedetto, Paul Eaton, D.G. Mavis et al. · IEEE Transactions on Nuclear Science · 2006 · 138 citations

Engineering, Computer Engineering, Electrical Engineering +14

Heavy ion-induced digital single-event transients in deep submicron Processes

J.M. Benedetto, Paul Eaton, Keith Avery et al. · IEEE Transactions on Nuclear Science · 2004 · 134 citations

Engineering, Computer Engineering, Electrical Engineering +17