Paul Eaton

Soft error rate mitigation techniques for modern microcircuits

D.G. Mavis, Paul Eaton · 2003 · 359 citations

Engineering, Vlsi Design, Computer Architecture +17

Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies

Balaji Narasimham, B. L. Bhuva, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science · 2007 · 170 citations

Engineering, Vlsi Design, Nuclear Physics +21

Single event transient pulse widths in digital microcircuits

Matthew J. Gadlage, Ronald D. Schrimpf, J.M. Benedetto et al. · IEEE Transactions on Nuclear Science · 2004 · 146 citations

Engineering, Vlsi Design, Computer Architecture +17

Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits

Jonathan R. Ahlbin, L. W. Massengill, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2009 · 144 citations

Electrical Engineering, Heavy-ion Broad-beam Experiments, Engineering +12

Digital Single Event Transient Trends With Technology Node Scaling

J.M. Benedetto, Paul Eaton, D.G. Mavis et al. · IEEE Transactions on Nuclear Science · 2006 · 136 citations

Event-driven Architecture, Electrical Engineering, Engineering +13