Balaji Narasimham

Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices

N. Seifert, P. Slankard, Martin Kirsch et al. · 2006 · 202 citations

Hardware Security, Electrical Engineering, Engineering +11

Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies

Balaji Narasimham, B. L. Bhuva, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science · 2007 · 170 citations

Engineering, Vlsi Design, Nuclear Physics +21

On-Chip Characterization of Single-Event Transient Pulsewidths

Balaji Narasimham, Vishwa Ramachandran, B. L. Bhuva et al. · IEEE Transactions on Device and Materials Reliability · 2006 · 146 citations

Random Set Pulses, Electrical Engineering, Chip-scale Package +12

Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits

Jonathan R. Ahlbin, L. W. Massengill, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2009 · 144 citations

Electrical Engineering, Heavy-ion Broad-beam Experiments, Engineering +12

Scaling Trends in SET Pulse Widths in Sub-100 nm Bulk CMOS Processes

Matthew J. Gadlage, Jonathan R. Ahlbin, Balaji Narasimham et al. · IEEE Transactions on Nuclear Science · 2010 · 89 citations

Set Pulse Widths, Engineering, Vlsi Design +17