Martin Kirsch is an author at Intel (United States) specializing in electrical engineering, computer engineering, and vlsi design.
Top concepts
EngineeringVlsi DesignMicroelectronicsComputer EngineeringComputer ArchitectureElectrical EngineeringPhysicsLogic DevicesApplied PhysicsInstrumentation
Publications per year
2006–2012
2
2
Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices
N. Seifert, P. Slankard, Martin Kirsch et al. · 2006 · 202 citations
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