IEEE Transactions on Nuclear Science · 1996 · 611 citations · 24 references
ComputingComputer EngineeringComputer SystemsFault ToleranceFault-tolerant ComputingFault-tolerant SystemsFault DetectionHardware Fault ToleranceRadiation Hardened Computer ArchitectureRadiation-hardened Memory DevicesRandom Access Memory (Ram)Random-access MemorySingle Event Effects
Ground level upsets have been observed in computer systems containing large amounts of random access memory (RAM). Atmospheric neutrons are most likely the major cause of the upsets based on measured data using the Weapons Neutron Research (WNR) neutron beam.
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Single-event effects in avionics
E. Normand · IEEE Transactions on Nuclear Science · 1996 · 414 citations
Engineering, Aerospace Engineering, Computer Engineering +16
Effect of Cosmic Rays on Computer Memories
J. F. Ziegler, W. A. Lanford · Science · 1979 · 395 citations
Engineering, Computer Engineering, Electrical Engineering +14
A New Physical Mechanism for Soft Errors in Dynamic Memories
T.C. May, M. H. Woods · Reliability physics · 1978 · 228 citations