T.C. May

Alpha-particle-induced soft errors in dynamic memories

T.C. May, M. H. Woods · IEEE Transactions on Electron Devices · 1979 · 846 citations

Engineering, Computer Architecture, Dynamic Ram +16

A New Physical Mechanism for Soft Errors in Dynamic Memories

T.C. May, M. H. Woods · Reliability physics · 1978 · 227 citations

Hardware Security, Memory Architecture, Engineering +13

Soft Errors in VLSI: Present and Future

T.C. May · IEEE Transactions on Components Hybrids and Manufacturing Technology · 1979 · 59 citations

Engineering, Vlsi Design, Error Control Technique +21

Dynamic Fault Imaging of VLSI Random Logic Devices

T.C. May, G. Scott, Eugene S. Meieran et al. · Reliability physics · 1984 · 50 citations

Engineering, Logic States, Computer Architecture +16

Alpha-particle-induced charge collection measurements and the effectiveness of a novel p-well protection barrier on VLSI memories

S. Fu, A.M. Mohsen, T.C. May · IEEE Transactions on Electron Devices · 1985 · 42 citations

Experimental Results, Electrical Engineering, Engineering +10