Eugene S. Meieran

Electromigration in Thin Al Films

I. A. Blech, Eugene S. Meieran · Journal of Applied Physics · 1969 · 188 citations

Materials Science, Aluminium Nitride, Electrical Engineering +11

Enhanced X-Ray Diffraction from Substrate Crystals Containing Discontinuous Surface Films

Ilan A. Blech, Eugene S. Meieran · Journal of Applied Physics · 1967 · 155 citations

X-ray Crystallography, Engineering, Mechanical Engineering +18

DIRECT TRANSMISSION ELECTRON MICROSCOPE OBSERVATION OF ELECTROTRANSPORT IN ALUMINUM THIN FILMS

I. A. Blech, Eugene S. Meieran · Applied Physics Letters · 1967 · 133 citations

Materials Science, Aluminium Nitride, Electromigration Technique +13

X-Ray Extinction Contrast Topography of Silicon Strained by Thin Surface Films

Eugene S. Meieran, Ilan A. Blech · Journal of Applied Physics · 1965 · 73 citations

Materials Science, Engineering, Physics +15

Dynamic Fault Imaging of VLSI Random Logic Devices

T.C. May, G. Scott, Eugene S. Meieran et al. · Reliability physics · 1984 · 50 citations

Engineering, Logic States, Computer Architecture +16