Eugene S. Meieran

Statistics

Publications

Citations

992

H-Index

Active since

1962

Affiliations

Fairchild Semiconductor (United States)(Current)

Intel (United States)

Eugene S. Meieran is an author at Fairchild Semiconductor (United States) specializing in natural sciences, materials science, and materials engineering.

Publications per year

1962–1995

Publications

Electromigration in Thin Al Films

I. A. Blech, Eugene S. Meieran · Journal of Applied Physics · 1969 · 188 citations

Natural Sciences, Materials Engineering, Materials Science +12

Enhanced X-Ray Diffraction from Substrate Crystals Containing Discontinuous Surface Films

Ilan A. Blech, Eugene S. Meieran · Journal of Applied Physics · 1967 · 155 citations

Natural Sciences, Materials Engineering, Materials Science +17

DIRECT TRANSMISSION ELECTRON MICROSCOPE OBSERVATION OF ELECTROTRANSPORT IN ALUMINUM THIN FILMS

I. A. Blech, Eugene S. Meieran · Applied Physics Letters · 1967 · 135 citations

Natural Sciences, Electrical Engineering, Materials Science +9

X-Ray Extinction Contrast Topography of Silicon Strained by Thin Surface Films

Eugene S. Meieran, Ilan A. Blech · Journal of Applied Physics · 1965 · 73 citations

Natural Sciences, Materials Engineering, Materials Science +17

Dynamic Fault Imaging of VLSI Random Logic Devices

T.C. May, G. Scott, Eugene S. Meieran et al. · Reliability physics · 1984 · 51 citations

Engineering, Computer Engineering, Electrical Engineering +14

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