Ilan A. Blech

Enhanced X-Ray Diffraction from Substrate Crystals Containing Discontinuous Surface Films

Ilan A. Blech, Eugene S. Meieran · Journal of Applied Physics · 1967 · 155 citations

X-ray Crystallography, Engineering, Mechanical Engineering +18

<i>I</i> <i>n</i> <i>s</i> <i>i</i> <i>t</i> <i>u</i> stress measurement of refractory metal silicides during sintering

J.T. Pan, Ilan A. Blech · Journal of Applied Physics · 1984 · 117 citations

Engineering, Refractory Metal Silicides, Residual Stress +18

X-Ray Extinction Contrast Topography of Silicon Strained by Thin Surface Films

Eugene S. Meieran, Ilan A. Blech · Journal of Applied Physics · 1965 · 73 citations

Materials Science, Engineering, Physics +15

Measurement of thermal expansion coefficients of W, WSi, WN, and WSiN thin film metallizations

A. Lahav, K. A. Grim, Ilan A. Blech · Journal of Applied Physics · 1990 · 39 citations

Engineering, Refractory Gate, Thermal Expansion Coefficients +20

X-ray topography of single crystal NiO

Ilan A. Blech, Eugene S. Meieran · Philosophical magazine · 1966 · 37 citations

X-ray Crystallography, Materials Science, Magnetism +15