Ilan A. Blech - Concepedia

Author

Ilan A. Blech

Fairchild Semiconductor (United States)

Also Known As

ILAN A. BLECH, Ilan A. Blech, Ilan Blech

Publications

651

Citations

H-Index

Concepts

All Affiliations

Fairchild Semiconductor (United States)

About

Ilan A. Blech is an author at Fairchild Semiconductor (United States) specializing in materials science, applied physics, and engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	12	12	591
2	Applied Physics	12	12	591
3	Materials Science	12	12	591
4	Electrical Engineering	2	2	74
5	Materials Engineering	2	2	167

Ilan A. Blech

Publications

591

Citations

H-Index

Page 1

	Year	Citations
Enhanced X-Ray Diffraction from Substrate Crystals Containing Discontinuous Surface Films Ilan A. Blech, Eugene S. Meieran Journal of Applied Physics X-ray CrystallographyEngineeringMechanical EngineeringStressstrain AnalysisStressed Surface Films	1967	155
<i>I</i> <i>n</i> <i>s</i> <i>i</i> <i>t</i> <i>u</i> stress measurement of refractory metal silicides during sintering J.T. Pan, Ilan A. Blech Journal of Applied Physics EngineeringRefractory Metal SilicidesResidual StressThin Film Process TechnologyStructural Materials	1984	117
X-Ray Extinction Contrast Topography of Silicon Strained by Thin Surface Films Eugene S. Meieran, Ilan A. Blech Journal of Applied Physics Materials ScienceEngineeringPhysicsOptical PropertiesSilicon Debugging	1965	73
Measurement of thermal expansion coefficients of W, WSi, WN, and WSiN thin film metallizations A. Lahav, K. A. Grim, Ilan A. Blech Journal of Applied Physics EngineeringRefractory GateThermal Expansion CoefficientsSemiconductorsThermal Analysis	1990	39
X-ray topography of single crystal NiO Ilan A. Blech, Eugene S. Meieran Philosophical magazine X-ray CrystallographyMaterials ScienceMagnetismMagnetic PropertiesX-ray Spectroscopy	1966	37
The Failure of Thin Alluminum Current-Carrying Strips on Oxidized Silicon Ilan A. Blech, Harry Sello Physics of failure in electronics Aluminium NitrideEngineeringSilicon On InsulatorCorrosionNew Mode	1966	35
Stacking-Fault Contrast in X-Ray Topographs of Annealed Si Web Dendrite Eugene S. Meieran, Ilan A. Blech Journal of Applied Physics X-ray SpectroscopyEngineeringDefect ToleranceX-ray FluorescenceDislocation Contrast	1967	33
Determination of thin-film stresses on round substrates Ilan A. Blech, I. A. Blech, M. Finot Journal of Applied Physics Thin-film StressesEngineeringResidual StressMechanics ModelingStressstrain Analysis	2005	27
X-RAY SURFACE TOPOGRAPHY OF DIFFUSION-GENERATED DISLOCATIONS IN SILICON Ilan A. Blech, Eugene S. Meieran, Harry Sello Applied Physics Letters Materials ScienceEngineeringDislocation InteractionPhysicsCrystalline Defects	1965	25
Linear thermal expansion coefficient and biaxial elastic modulus of diamondlike carbon films Ilan A. Blech, Peter C. Wood Journal of Vacuum Science & Technology A Vacuum Surfaces and Films EngineeringStress-temperature MeasurementsBiaxial Elastic ModulusThin Film Process TechnologyChemical Deposition	1993	24

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