I. A. Blech - Concepedia

Author

I. A. Blech

Technion – Israel Institute of Technology

Also Known As

Blech, I. A., I A Blech, I. A. BLECH, I. A. Blech, I. Blech, I.A Blech, I.A. Blech, Iditt Blech

Publications

11.8K

Citations

H-Index

Concepts

All Affiliations

Technion – Israel Institute of Technology Fairchild Semiconductor (United States)Massachusetts Institute of Technology Palo Alto Research Center

About

I. A. Blech is an author at Technion – Israel Institute of Technology specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	28	39	11.5K
2	Applied Physics	27	37	11.3K
3	Natural Sciences	4	4	549
4	Chemistry	2	2	26
5	Computer Engineering	1	1	69

I. A. Blech

Publications

11.5K

Citations

H-Index

Page 1

	Year	Citations
Metallic Phase with Long-Range Orientational Order and No Translational Symmetry D. Shechtman, I. A. Blech, D. Gratias, Physical Review Letters Materials ScienceMagnetismCrystal StructureEngineeringPhysics	1984	6.9K
Electromigration in thin aluminum films on titanium nitride I. A. Blech Journal of Applied Physics Materials ScienceElectrical EngineeringThin Aluminum FilmsEngineeringElectromigration Technique	1976	1.2K
Stress generation by electromigration I. A. Blech, Conyers Herring Applied Physics Letters ElectrohydrodynamicsEngineeringStress GradientsTransmission X-ray TopographyResidual Stress	1976	511
Multiple Scattering of Neutrons in Vanadium and Copper I. A. Blech, B. L. Averbach Physical Review Multiple ScatteringEngineeringNuclear PhysicsPhysicsCross Sections	1965	453
The microstructure of rapidly solidified Al6Mn D. Shechtman, I. A. Blech Metallurgical Transactions A Materials ScienceMaterials EngineeringEngineeringApplied PhysicsSolidification	1985	373
Electromigration in Thin Al Films I. A. Blech, Eugene S. Meieran Journal of Applied Physics Materials ScienceAluminium NitrideElectrical EngineeringTest StripEngineering	1969	188
Electromigration in thin gold films on molybdenum surfaces I. A. Blech, E. Kinsbron Thin Solid Films Materials ScienceElectromigration TechniqueEngineeringSurface ScienceApplied Physics	1975	172
Measurement of stress gradients generated by electromigration I. A. Blech, K. Tai Applied Physics Letters ElectrohydrodynamicsEngineeringStress GradientsMechanical EngineeringAluminum Films	1977	155
Stresses, curvatures, and shape changes arising from patterned lines on silicon wafers Yulin Shen, S. Suresh, I. A. Blech Journal of Applied Physics EngineeringMechanical EngineeringSilicon On InsulatorOverall CurvaturesPoisson Effect	1996	152
DIRECT TRANSMISSION ELECTRON MICROSCOPE OBSERVATION OF ELECTROTRANSPORT IN ALUMINUM THIN FILMS I. A. Blech, Eugene S. Meieran Applied Physics Letters Materials ScienceAluminium NitrideElectromigration TechniqueEngineeringPhysics	1967	133

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